Holographic Grating Erasing Characteristics by Non-polarized Beam in Amorphous Chalcogenide Thin Films
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چکیده
منابع مشابه
Ag-photodoping in Ge-chalcogenide amorphous thin films—Reaction products and their characterization
We make a brief review on the effect of silver photodiffusion in Ge-chalcogenide glasses and report some of our recent results in this aspect. Using Raman spectroscopy and X-ray diffraction analysis we demonstrate that the hosting backbone undergoes depletion in chalcogen due to the specific conditions of photodiffusion and the diffusion products are silver chalcogenides. While in the Ge–Se sys...
متن کاملThe Li Insertion/Extraction Characteristics of Amorphous Silicon Thin Films
Amorphous hydrogenated silicon (a-Si:H) is known to be a perspective material for negative electrodes of modern lithium-ion batteries. The electrochemical lithium insertion into thin-film a-Si:H electrodes is studied using chronopotentiometry, cyclic voltammetry (CV), and electrochemical impedance spectroscopy (EIS). The electrodes were grown on stainless-steel substrates by glow discharge at t...
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ژورنال
عنوان ژورنال: Transactions on Electrical and Electronic Materials
سال: 2006
ISSN: 1229-7607
DOI: 10.4313/teem.2006.7.3.141